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Preliminary study of statistical pattern recognition-based coin counterfeit detection by means of high resolution 3D scanners
Leich, Marcus ; Kiltz, Stefan ; Krätzer, Christian ; Dittmann, Jana ; Vielhauer, Claus
Three-dimensional imaging, interaction, and measurement. - Bellingham, Wash. : SPIE [u.a.], 2011 - (Proceedings of SPIE; 7864); Kongress: Conference on Three-Dimensional Imaging, Interaction, and Measurement; (San Francisco, Calif.) : 2011.01.24-27
Bibliographie: Originalartikel in begutachteter zeitschriftenartiger Reihe Link 3 Zitationen
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