« Publikationen
Numerical investigations of the strain behavior in nanoscale patterned strained silicon structures
Naumann, F. ; Moutanabbir, O. ; Reiche, M. ; Schriever, Clemen ; Schilling, Jörg ; Petzold, M.
2010 11th international thermal, mechanical & multi-physics simulation, and experiments in microelectronics and microsystems. - Piscataway, NJ : IEEE, insges. 5 S.
Bibliographie: Konferenz/Aufsatz
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